Intrinsic stress in vacuum-deposited titanium on single-crystal silicon wafers
โ Scribed by J. Ahn; S.J. Lewis
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 119 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Consequently, provided only low strains are involved, the dislocation density for [OlO] tungsten crystals deformed in tension at 295ยฐK can be determined from the etch pit density on (001) faces. These results support the contention of Wronski and Johnson(2) that the use of etch pit techniques to det
## Orientation and thickness dependence of stress-strain curves in vacuum deposited single crystal silver films\* Mechanical properties of thin f.c.c. metal films formed by vacuum deposition have been studied by several authors.~~-?j Thev reported that the stress-" strain curves of the deposited f