Orientation dependence of stress-strain curves in vacuum deposited single crystal gold films

✍ Scribed by M. Fukamachi; S. Nagakura; S. Oketani

• Publisher: Elsevier Science
• Year: 1967
• Weight: 507 KB
• Volume: 15
• Category: Article
• ISSN: 0001-6160
• DOI: 10.1016/0001-6160(67)90016-8

✦ Synopsis

Consequently, provided only low strains are involved, the dislocation density for [OlO] tungsten crystals deformed in tension at 295°K can be determined from the etch pit density on (001) faces. These results support the contention of Wronski and Johnson(2) that the use of etch pit techniques to determine the dislocation density can produce a significant error in determining absolute values of dislocation properties. It is interesting to note that if the dislocation densities as determined by electron microscopy in the present work (multiplied by 2 to allow for the different methods of describing dislocation densities) are used to calculate the rate of change of resistivity with dislocation density from the resistivity data of Shukovsky et d.(l) the value of about 0.75 x lo-l2 @&cm3 differs from that of Baskinski et ~1.") by a factor of only 2.5. The authors are grateful to Mr. D. C. Wynne for assistance with the electron microscopy.