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Intrinsic SiC/SiO2 Interface States

✍ Scribed by Afanasev, V. V. ;Bassler, M. ;Pensl, G. ;Schulz, M.

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 341 KB
Volume: 162
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(199707)162:1<321::aid-pssa321>3.0.co;2-f

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