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Electron Transport at the SiC/SiO2 Interface

✍ Scribed by Ouisse, T.

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 458 KB
Volume: 162
Category: Article
ISSN: 0031-8965
DOI: 10.1002/1521-396x(199707)162:1<339::aid-pssa339>3.0.co;2-g

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