✦ LIBER ✦
Highly reliable SiO2/SiN/SiO2(ONO) gate dielectric on 4H-SiC
✍ Scribed by Satoshi Tanimoto
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 636 KB
- Volume
- 90
- Category
- Article
- ISSN
- 8756-663X
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