✦ LIBER ✦

Intrinsic band edge traps in nano-crystalline HfO2 gate dielectrics

✍ Scribed by G. Lucovsky; Y. Zhang; J. Luning; V.V. Afanase’v; A. Stesmans; S. Zollner; D. Triyoso; B.R. Rogers; J.L. Whitten

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Bulk defects in nano-crystalline and in

✍ S. Lee; H. Seo; G. Lucovsky; L.B. Fleming; M.D. Ulrich; J. Lüning 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 458 KB

Control of Interface Traps in HfO2Gate D

✍ S. Y. Tan 📂 Article 📅 2010 🏛 Springer US 🌐 English ⚖ 558 KB

Asymmetric Energy Distribution of Interf

✍ J. Han; E. Vogel; E. Gusev; C. D'emic; C. Richter; D. Heh; J. Suehle 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 133 KB

[IEEE 2007 International Workshop on Ele

✍ Shahil, K. M. Farhan; Arafat, Md. Nayeem; Khosru, Q. D. M.; Khan, M. Rezwan 📂 Article 📅 2007 🏛 IEEE ⚖ 752 KB