✦ LIBER ✦
Asymmetric Energy Distribution of Interface Traps in n- and p-MOSFETs With<tex>$hbox HfO _2$</tex>Gate Dielectric on Ultrathin SiON Buffer Layer
✍ Scribed by J. Han; E. Vogel; E. Gusev; C. D'emic; C. Richter; D. Heh; J. Suehle
- Book ID
- 126697015
- Publisher
- IEEE
- Year
- 2004
- Tongue
- English
- Weight
- 133 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0741-3106
No coin nor oath required. For personal study only.