## Abstract Depth analyses of oxidized Cu–Ni alloys were performed in the constant voltage mode by glow discharge optical emission spectroscopy. A Cu‐rich oxide was segregated on the surface of Cu–Ni oxidized layer and, moreover, the discharge current varied strongly with the sputtering time. There
Interpretation of Depth Profiles Obtained by DC-Glow Discharge Sputtering
✍ Scribed by Čermák, J. ;Stloukal, I.
- Book ID
- 105385210
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 403 KB
- Volume
- 158
- Category
- Article
- ISSN
- 0031-8965
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