Interface traps and Pb centers in oxidized (100) silicon wafers

✍ Scribed by Gerardi, Gary J.; Poindexter, Edward H.; Caplan, Philip J.; Johnson, Noble M.

• Book ID: 117997118
• Publisher: American Institute of Physics
• Year: 1986
• Tongue: English
• Weight: 429 KB
• Volume: 49
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.97611