Pb1 defect study and chemical characterization of the Si(001)SiO2 interface in oxidized porous silicon

✍ Scribed by J.L. Cantin; M. Schoisswohl; H.J. von Bardeleben; F. Rochet; G. Dufour

• Book ID: 116067847
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 333 KB
• Volume: 352-354
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(95)01230-3