✦ LIBER ✦
X and K band ESR study of the Pb interface centres in thermally oxidized p-type (001)Si wafers at low temperatures and influence of medium-dose As+ ion implantation
✍ Scribed by A. Stesmans; J. Braet; J. Witters; R.F. Dekeersmaecker
- Publisher
- Elsevier Science
- Year
- 1984
- Weight
- 136 KB
- Volume
- 141
- Category
- Article
- ISSN
- 0167-2584
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