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Interface states in Si-SiO2 interfaces : H. Deuling, E. Klausmann and A. Goetzberger. Solid State Electron. 15 (1972), p. 559

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 109 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90444-1

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