Expedient method of obtaining interface state properties from MIS conductance measurements : E. H. Nicollian, A. Goetzberger and A. D. Lopez, Solid-St. Electron. 12 (1969), p. 937

• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 107 KB
• Volume: 9
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(70)90514-7