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Interface roughness and period variations in MQW structures determined by X-ray diffraction

✍ Scribed by Fewster, P. F.

Book ID: 114500133
Publisher: International Union of Crystallography
Year: 1988
Tongue: English
Weight: 648 KB
Volume: 21
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889888006569

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