𝔖 Bobbio Scriptorium

✦ LIBER ✦

Integrative Software Design for Reliability: Beyond Models and Defect Prediction

✍ Scribed by Asthana, Abhaya; Okumoto, Kazu

Book ID: 118753601
Publisher: Institute of Electrical and Electronics Engineers
Year: 2012
Tongue: English
Weight: 924 KB
Volume: 17
Category: Article
ISSN: 1089-7089
DOI: 10.1002/bltj.21557

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Software metrics model for integrating q

Software metrics model for integrating quality control and prediction

✍ Norman F. Schneidewind 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 41 KB

Exhaustive and heuristic search approach

Exhaustive and heuristic search approaches for learning a software defect prediction model

✍ Parag C. Pendharkar 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 382 KB

ANP-based software reliability predictio

ANP-based software reliability prediction using PoCs and subsequent employment of orthogonal defect classification measurements for risk mitigation during prototype studies

✍ K. Krishna Mohan; A. Srividya; A. K. Verma 📂 Article 📅 2010 🏛 Springer-Verlag 🌐 English ⚖ 753 KB

Lifetime Prediction and Design-for-Relia

Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects

✍ Xiangdong Xuan; Adit D. Singh; Abhijit Chatterjee 📂 Article 📅 2006 🏛 Springer US 🌐 English ⚖ 366 KB

CAD and office integration: OLE for desi

CAD and office integration: OLE for design and modeling—a new technology for CA-software: By Ulrich Sendler Springer-Verlag, Berlin Heidelberg, 1996, 162 pp, £29.50 ISBN 3-540-60292-5 (hardcover)

✍ S.M. Joshi; D. Veeramani 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 118 KB

[IEEE 46th International Symposium on Re

[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - G-renewal process as a model for statistical warranty claim prediction

✍ Kaminskiy, M.P.; Krivtsov, V.V. 📂 Article 📅 2000 🏛 IEEE ⚖ 405 KB