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ANP-based software reliability prediction using PoCs and subsequent employment of orthogonal defect classification measurements for risk mitigation during prototype studies

✍ Scribed by K. Krishna Mohan; A. Srividya; A. K. Verma


Book ID
107689311
Publisher
Springer-Verlag
Year
2010
Tongue
English
Weight
753 KB
Volume
1
Category
Article
ISSN
0975-6809

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