𝔖 Bobbio Scriptorium

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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - G-renewal process as a model for statistical warranty claim prediction

✍ Scribed by Kaminskiy, M.P.; Krivtsov, V.V.

Book ID: 115545420
Publisher: IEEE
Year: 2000
Weight: 405 KB
Volume: 0
Category: Article
ISBN-13: 9780780358485
DOI: 10.1109/rams.2000.816321

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