✦ LIBER ✦
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects
✍ Scribed by Xiangdong Xuan; Adit D. Singh; Abhijit Chatterjee
- Book ID
- 106384308
- Publisher
- Springer US
- Year
- 2006
- Tongue
- English
- Weight
- 366 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0923-8174
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