For all MEMS devices a high coupling between the mechanical and electrical domain is desired. Figures of merit describing the coupling are important for comparing different piezoelectric materials. The existing figures of merit are discussed and a new figure of merit is introduced for a fair compari
Integrated CNTs thin film for MEMS mechanical sensors
β Scribed by Van Thanh Dau; Takeo Yamada; Dzung Viet Dao; Bui Thanh Tung; Kenji Hata; Susumu Sugiyama
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 619 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0026-2692
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β¦ Synopsis
This paper reports the top-down fabrication of CNTs thin film on MEMS structure, and characterization of piezoresistive coefficients of aligned single wall carbon nanotube (SWNT) forest film. The film was synthesized by water-assisted chemical vapor deposition (CVD), a process known as ''super growth''. CNTs film was condensed, manually maneuvered and conveniently patterned by EB lithography to form desirable shapes. The longitudinal and transverse gauge factors of the CNTs thin film were measured to be 3.75 and 0.67, respectively.
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