𝔖 Bobbio Scriptorium

✦ LIBER ✦

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - From specification validation to hardware testing: a unified method

✍ Scribed by Al Hayek, G.; Robach, C.

Book ID: 126923210
Publisher: Int. Test Conference
Year: 1996
Tongue: English
Weight: 949 KB
Category: Article
ISBN-13: 9780780335417
DOI: 10.1109/test.1996.557150

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Iddq test: sensitivity analysis of scaling

✍ Williams, T.W.; Dennard, R.H.; Kapur, R.; Mercer, M.R.; Maly, M. 📂 Article 📅 1996 🏛 Int. Test Conference ⚖ 643 KB

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - ASIC BIST synthesis: a VHDL approach

✍ Eberle, T.; McVay, B.; Meyers, C.; Moore, J. 📂 Article 📅 1996 🏛 Int. Test Conference 🌐 English ⚖ 944 KB

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Three different MCMs, three different test strategies

✍ Flint, A. 📂 Article 📅 1996 🏛 Int. Test Conference ⚖ 572 KB

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - ASIC yield estimation at early design cycle

✍ Vonkyoung Kim, ; Tegethoff, M.; Chen, T. 📂 Article 📅 1996 🏛 Int. Test Conference ⚖ 574 KB

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - BIST fault diagnosis in scan-based VLSI environments

✍ Yuejian Wu, ; Adham, S. 📂 Article 📅 1996 🏛 Int. Test Conference 🌐 English ⚖ 1016 KB

[Int. Test Conference International Test

[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Defect-oriented IC test and diagnosis using VHDL fault simulation

✍ Celeiro, F.; Dias, L.; Ferreira, J.; Santos, M.B.; Teixeira, J.P. 📂 Article 📅 1996 🏛 Int. Test Conference 🌐 English ⚖ 926 KB