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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - ASIC yield estimation at early design cycle

✍ Scribed by Vonkyoung Kim, ; Tegethoff, M.; Chen, T.

Book ID: 126685118
Publisher: Int. Test Conference
Year: 1996
Weight: 574 KB
Category: Article
ISBN-13: 9780780335417
DOI: 10.1109/TEST.1996.557110

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