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Instability and gate voltage noise in GaAs metal-semiconductor field-effect transistors

โœ Scribed by Day, D. J.; Trudeau, M.; McAlister, S. P.; Hurd, C. M.


Book ID
121717093
Publisher
NRC Research Press
Year
1989
Tongue
English
Weight
199 KB
Volume
67
Category
Article
ISSN
0008-4204

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