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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Yokohama, Japan (23-25 May 1995)] Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95 - Effects of recovery characteristics of diodes on the performances of snubber and PFC circuits

✍ Scribed by Shinohara, S.; Kobayashi, H.; Saito, R.; Hasegawa, Y.

Book ID: 120045268
Publisher: Inst. Electr. Eng. Japan
Year: 1995
Weight: 342 KB
Category: Article
ISBN-13: 9780780326187
DOI: 10.1109/ISPSD.1995.515069

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