Infrared absorption spectra of 4H silicon carbide
β Scribed by C.Q. Chen; R. Helbig; F. Engelbrecht; J. Zeman
- Publisher
- Springer
- Year
- 2001
- Tongue
- English
- Weight
- 188 KB
- Volume
- 72
- Category
- Article
- ISSN
- 1432-0630
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π SIMILAR VOLUMES
Defects caused by 15R polytype inclusions in 4H silicon carbide ingots have been considered. Growth rate along with curvature of the interface determines the stability of the 4H-polytype reproduction. The domain structure arising in the 4H polytype as a result of foreign polytype inclusion has been
## Abstract We report on the optical spectroscopies performed on porous SiC obtained by electrochemical etching of 6HβSiC wafers. Strong modifications of Raman and infrared spectra, characteristic of the porous material, have been detected. Various effective medium approximations have been employed