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Influence of the cap layer thickness on photoluminescence properties in strained InGaAs/GaAs single quantum wells

โœ Scribed by Shen, W. Z. ;Tang, W. G. ;Shen, S. C. ;Wang, S. M. ;Anderson, T.


Publisher
Springer
Year
1994
Tongue
English
Weight
326 KB
Volume
15
Category
Article
ISSN
0195-9271

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We present photoluminescence investigations of GalnAs/GaAs quantum wells with thin cap layers ranging from 20 nm in thickness down to a complete cap layer removal. We observe a strong blue shift of up to 35 meV for an uncovered surface quantum well. A further shift up to the GaAs band edge can be ob

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The effects of strain on the carrier confinement profile of disordered InGaAs/GaAs single quantum wells, assuming an error function compositional profile after interdiffusion, are studied here. Details are given showing how strain and disonder modify the confinement profile, the ground state transit