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Influence of Temperature and Frequency on Dielectric Permittivity and ac Conductivity of Au/SnO 2 /n-Si (MOS) Structures

✍ Scribed by Ertuğrul, R.; Tataroğlu, A.


Book ID
121500954
Publisher
Institute of Physics
Year
2012
Tongue
English
Weight
595 KB
Volume
29
Category
Article
ISSN
0256-307X

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