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Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure

✍ Scribed by A. Tatarogˇlu; Ş. Altındal; M.M. Bülbül


Book ID
108207456
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
210 KB
Volume
81
Category
Article
ISSN
0167-9317

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