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Frequency and gate voltage effects on the dielectric properties of Au/SiO2/n-Si structures

✍ Scribed by İlbilge Dökme; Şemsettin Altındal; Muharrem Gökçen

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
295 KB
Volume
85
Category
Article
ISSN
0167-9317

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