XPS characterization of different therma
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A. Montesdeoca-Santana; E. Jiménez-Rodríguez; N. Marrero; B. González-Díaz; D. B
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Article
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2010
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Elsevier Science
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English
⚖ 410 KB
In this work we have applied the X-ray photoelectron spectroscopy (XPS) in depth to study, for the first time, the influence of different thermal treatments in the ITO-Si interface of a monocrystalline Si-based solar cell where the Si surface is carbonate-textured and covered by an ITO sputtered lay