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Influence of dynamic annealing on the shape of channeling implantation profiles in Si and SiC

โœ Scribed by Posselt, M.; Bischoff, L.; Teichert, J.; Ster, A.


Book ID
121225678
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
507 KB
Volume
93
Category
Article
ISSN
0021-8979

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