Inelastic electron tunneling spectroscopy of Si MIS structures with ultrathin thermal silicon nitride and thermal silica

✍ Scribed by Kovchavtsev, A. P. ;Kurishev, G. L. ;Postnikov, K. O. ;Sokolov, R. A. ;Subbotin, I. M.

• Book ID: 105380506
• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 347 KB
• Volume: 106
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211060240