✦ LIBER ✦
Manifestation of excess centers of electron-hole pair generation resulting from field and thermal stresses and their subsequent annihilation in dynamic current-voltage characteristics of Si-MOS structures with ultrathin oxide
✍ Scribed by E. I. Goldman; N. F. Kukharskaya; V. G. Narishkina; G. V. Chucheva
- Book ID
- 111444980
- Publisher
- Springer
- Year
- 2011
- Tongue
- English
- Weight
- 217 KB
- Volume
- 45
- Category
- Article
- ISSN
- 1063-7826
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