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Structural Changes of Porous Silicon Surface with Thermal Annealing Studied by 29Si Nuclear Magnetic Resonance Spectroscopy and Fourier Transform Infrared Spectroscopy

✍ Scribed by Takashi Tsuboi; Tetsuo Sakka; Yukio H. Ogata; Shizuo Naito


Book ID
110278484
Publisher
Springer
Year
2000
Tongue
English
Weight
34 KB
Volume
7
Category
Article
ISSN
1380-2224

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