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Indium-tin-oxide thin film deposited by a dual ion beam assisted e-beam evaporation system

✍ Scribed by J.W Bae; J.S Kim; G.Y Yeom


Book ID
114164815
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
344 KB
Volume
178
Category
Article
ISSN
0168-583X

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Indium tin oxide thin films prepared by
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## Abstract Indium tin oxide (ITO) films have been deposited onto glass substrates at room temperature by ion beam assisted deposition technique (IBAD) at different ion beam currents (80–120 mA). The effect of the ion beam current on films properties has been studied. The films prepared at low ion

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## Abstract This work reports on the fabrication and characterization of indium oxide semiconducting films and their application in thin‐film transistors (TFTs). The films have been deposited at room temperature by oxygen ion beam assisted e‐beam evaporation. The influence of deposition conditions