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Incorporation scheme of H reducing defects in a-Si studied by NMR and ESR

✍ Scribed by Tatsuo Shimizu; Kenji Nakazawa; Minoru Kumeda; Shoichi Ueda

Publisher: Elsevier Science
Year: 1983
Weight: 193 KB
Volume: 117-118
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(83)90696-4

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