Incorporation of Deep Defects in GaN Induced by Doping and Implantation Processes

✍ Scribed by A. Krtschil; H. Witte; M. Lisker; J. Christen; A. Krost; U. Birkle; S. Einfeldt; D. Hommel; A. Wenzel; B. Rauschenbach

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 145 KB
• Volume: 216
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199911)216:1<587::aid-pssb587>3.0.co;2-t