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In situ monitoring and control of InGaP growth on GaAs in MOVPE

✍ Scribed by M. Zorn; T. Trepk; P. Kurpas; M. Weyers; J.-T. Zettler; W. Richter


Book ID
108342831
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
141 KB
Volume
195
Category
Article
ISSN
0022-0248

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In Situ Monitoring of GaN Growth in Mult
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Normal incidence reflectivity measurements were carried out in an AIX 2000G3HT Multiwafer Planetary Reactor 1 MOVPE system, a large scale production tool for GaN-based devices. In situ monitoring was used to investigate nucleation behaviour, temperature dependence of GaN growth, and the deposition o