✦ LIBER ✦

In situ measurement of oxide film growth on aluminium samples by holographic interferometry

✍ Scribed by K. Habib

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of the double layer capacita

✍ K. Habib 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 683 KB

## Measurement of the double layer capacitance of aluminium samples by

In Situ Observation of KB 5 Crystal Grow

✍ Wanchun, Chen; Yunxue, Shen; Wenyi, Ma; Ming, Li; Yansong, Chen 📂 Article 📅 1991 🏛 Institute of Physics 🌐 English ⚖ 299 KB

Measuring thermal conductivity of CVD di

✍ Leung, K.M.; Cheung, A.C.; Liu, B.C.; Woo, H.K.; Sun, C.; Shi, X.Q.; Lee, S.T. 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 127 KB

In situ film thickness and temperature c

✍ F.G. Boebel; H. Möller; B. Hertel; H. Grothe; G. Schraud; St. Schröder; P. Chow 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 690 KB

A simple method for the measurement of s

✍ B.S. Ramprasad; T.S. Radha 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 480 KB

Epitaxial growth of CuO thin films by in

✍ R. Kita; T. Hase; M. Sasaki; T. Morishita; S. Tanaka 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 364 KB