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In-situ HVEM study of the influence of localised strain, interfaces, and extrinsic point defects on {113}-defect generation in silicon

✍ Scribed by Vanhellemont, J. ;Romano-rodríguez, A.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
549 KB
Volume
138
Category
Article
ISSN
0031-8965

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