Properties of the recently reported deep-level radiation defects in oxygen-rich silicon (the M-center in p-type Si with the DLTS levels at E v ΓΎ 0:36 and E v ΓΎ 0:12 eV, and the X-center in n-type Si with the level at E c Γ 0:11 eV, respectively) are investigated by means of DLTS and IR absorption. W
β¦ LIBER β¦
Influence of oxygen and carbon on the generation and annihilation of radiation defects in silicon
β Scribed by M.-A. Trauwaert; J. Vanhellemont; H.E. Maes; A.-M. Van Bavel; G. Langouche; A. Stesmans; P. Clauws
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 273 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0921-5107
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## Abstract The origin of the lower minority carrier lifetime in the border region of multicrystalline silicon (mcβSi) ingots was investigated. Based on minority carrier lifetime measurements and chemical analyses, distributions of defects and impurities were studied. It is found that the content o