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In-plane strains measurement by using the electronic speckle pattern interferometry

✍ Scribed by Kim, Koung-Suk ;Jung, Hyun-Chul ;Kang, Ki-Soo ;Lee, Jong-Kook ;Jang, Soon-Suck ;Hong, Chung-Ki

Publisher: Springer-Verlag
Year: 1998
Tongue: Korean
Weight: 811 KB
Volume: 12
Category: Article
ISSN: 1226-4865
DOI: 10.1007/bf02947166

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