The surface profile of an Al thin film and its thickness have been observed by electronic speckle pattern interferometry (ESPI). The Michelson interferometer was used as our basic interferometric system to obtain interference fringes on a CCD camera. These interference fringes, arising from the path
Shape measurement by carrier modulation in electronic speckle pattern interferometry
β Scribed by Ping Sun; Zhen-xian Huang; Fei Liu
- Publisher
- Tianjin University of Technology
- Year
- 2008
- Tongue
- English
- Weight
- 362 KB
- Volume
- 4
- Category
- Article
- ISSN
- 1673-1905
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We have monitored the evolution of the strain-rates induced on an aluminium sample subjected to a uniaxial tensile test. At different load stages of the test, the strain-rate at each point of the field was obtained from fringe patterns generated by electronic speckle-pattern interferometry (ESPI), a
The noise in sawtooth fringes generated by electronic speckle pattern interferometry (ESPI) is investigated. When deformations of depolarising objects are studied, the scattered object light can be decomposed into two orthogonal linearly polarised speckle patterns which are partially decorrelated. T