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In depth generation lifetime profiling of heat-treated czochralski silicon

✍ Scribed by Braunig, D. ;Yang, K. H. ;Tan, T. Y. ;Schneider, C. P.

Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 562 KB
Volume: 92
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210920134

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