✦ LIBER ✦
Electron Beam Induced Current Versus Temperature Investigations of Localized Dislocations in Heat-Treated Czochralski Silicon
✍ Scribed by Jakubowicz, A. ;Habermeier, U. H.- ;Eisenbeiss, A. ;Käss, D.
- Publisher
- John Wiley and Sons
- Year
- 1987
- Tongue
- English
- Weight
- 449 KB
- Volume
- 104
- Category
- Article
- ISSN
- 0031-8965
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