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Improvement of water-related hot-carrier reliability by using ECR plasma-SiO2

โœ Scribed by Machida, K.; Shimoyama, N.; Takahashi, J.-I.; Takahashi, Y.; Yabumoto, N.; Arai, E.


Book ID
114535697
Publisher
IEEE
Year
1994
Tongue
English
Weight
624 KB
Volume
41
Category
Article
ISSN
0018-9383

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