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Improved automatic parameter extraction of InP-HBT small-signal equivalent circuits

✍ Scribed by Willen, B.; Rohner, M.; Schnyder, I.; Jackel, H.


Book ID
114554278
Publisher
IEEE
Year
2002
Tongue
English
Weight
172 KB
Volume
50
Category
Article
ISSN
0018-9480

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## Abstract An improved pad‐deembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree