A robust parameter extraction method for
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Sung-Jin Ho; Min Ki Choi; Daniel W. van der Weide
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Article
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2007
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John Wiley and Sons
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English
β 548 KB
## Abstract An improved padβdeembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree