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A peeling algorithm for extraction of the HBT small-signal equivalent circuit

✍ Scribed by Sheinman, B.; Wasige, E.; Rudolph, M.; Doerner, R.; Sidorov, V.; Cohen, S.; Ritter, D.


Book ID
114659734
Publisher
IEEE
Year
2002
Tongue
English
Weight
450 KB
Volume
50
Category
Article
ISSN
0018-9480

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## Abstract An improved pad‐deembedding technique for InGaP/GaAs HBT reducing uncertainty in measurement and equivalent circuit is proposed. Intrinsic elements are obtained by iteratively determining the external and internal base resistance. The extracted equivalent circuits demonstrate good agree