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Implantation damage and anomalous diffusion of implanted boron in silicon through SiO2 films

✍ Scribed by Kaabi, L. ;Gontrand, C. ;Lemiti, M. ;Balland, B.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
520 KB
Volume
138
Category
Article
ISSN
0031-8965

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