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Impact of the As dose in 0.35 μm EEPROM technology: characterization and modeling

✍ Scribed by N. Galbiati; G. Ghidini; C. Cremonesi; L. Larcher

Book ID: 108361833
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 272 KB
Volume: 41
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(01)00056-7

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