𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Impact of surface traps on the breakdown voltage of passivated AlGaN/GaN HEMTs under high-field stress

✍ Scribed by Luo, Qian; Du, Jiangfeng; Zhao, Ziqi; Yang, Mohua


Book ID
126514559
Publisher
The Institution of Engineering and Technology
Year
2012
Tongue
English
Weight
323 KB
Volume
7
Category
Article
ISSN
1750-0443

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES